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Plasma Cleaning of TEM Sample Holders

Oxygen plasma is a highly efficient, low priced and easy to use cleaning system also for TEM applications. TEM sample holders and inorganic samples contaminated with carbonous material can be thoroughly cleaned before or after analysis, leaving no residue. 

A plasma treatment with oxygen gas for 10-15 min. ashes residue-free carbon from exposed surfaces. This treatment results in extended contamination-free analysis time. The accuracy in quantification of thin sections is greatly improved. Furthermore, contaminations produced by the electron beam can be efficiently removed for optimal high resolution imaging or repetitive analysis (see literature 2-5).

Plasma-ACE   
can be easily upgraded for cleaning TEM sample holders. The upgrade of the reactor door includes a TEM-specific sample holder port. This allows the introduction of the TEM sample holder into the plasma reaction zone.

The advantages of plasma cleaning are obvious. The method is friendly to the environment because the cleaning process only produces carbon monoxide and/or carbon dioxide. Furthermore, the treatment is residue-free - mandatory in sensitive energy dispersive micro analysis or high resolution imaging.

Examples of cleaning TEM specimens, etc. .
TEM_LEO_before.jpg (3803 Byte) TEM sample holder cleaning  TEM_LEO_after.jpg (3376 Byte) TEM sample holder cleaning
before cleaning      after cleaning
Plasma cleaning (air) of contamination window created with cracked hydro carbons by the electron beam (SEM). 
Images: 
Carl Zeiss SMT
Dr. Kabius
 Asbest_Bilder_Herter_01.jpg (511490 Byte) TEM sample holder cleaning  Asbest_Bilder_Herter_03.jpg (521546 Byte) TEM sample holder cleaning Poly carbonate filters with asbestos fibres after  plasma treatment - all organic fibres are ashed away and only asbestos fibres withstand the treatment.

Images: 
MPI f. Molekulare Physiology Dortmund, Dr. Herter
TiAl_ONERA_01.jpg (17065 Byte) TEM sample holder cleaning TiAl TEM samples cleaned with O2-plasma. Note: Visible contamination layer on right hand side is gone after 10 min plasma treatment. Image: 
ONERA/LEM Paris 
Dr. Brisset
TiAl_ONERA_Ion_Damage_before_01.jpg (72878 Byte) TEM sample holder cleaning TEM sample with ion damage (black spots) in local areas and contamination layer visible at right hand edge. Image: 
ONERA/LEM Paris 
Dr. Brisset
TiAl_ONERA_Ion_Damage_after_01.jpg (72193 Byte)  TEM sample holder cleaning Sample cleaned with oxygen plasma. 
Note: irradiation damage has not increased.
Image: 
ONERA/LEM Paris 
Dr. Brisset
TiAl_ONERA_Ion_Damage_after_02.jpg (57184 Byte) TEM sample holder cleaning Same sample but different location with no irradiation damage after plasma cleaning. 
Image: 
ONERA/LEM Paris 
Dr. Brisset
Oxgen_20min.jpg (40731 Byte) TEM sample holder cleaning TiAl sample after 20 min oxygen treatment for carbonous contamination.
Magnification 650.000x
Image: 
KAIST Korea Advanced Institute for Science and Technology 
Sung-Soon Bai/ In Hwan Lee
Ar tot 5min.jpg (48829 Byte) TEM sample holder cleaning
Improvement for resolution after 5 min cleaning with Argon to remove oxidised layers.
Magnification 650.000x

Image: 
KAIST Korea Advanced Institute for Science and Technology 
Sung-Soon Bai/ In Hwan Lee

05.02.2008

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